Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/133533
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dc.coverage.spatialElectronic Science
dc.date.accessioned2017-02-02T11:51:12Z-
dc.date.available2017-02-02T11:51:12Z-
dc.identifier.urihttp://hdl.handle.net/10603/133533-
dc.description.abstractAbstract not available newline newline
dc.format.extent193p.
dc.languageEnglish
dc.relationNo. of references 102
dc.rightsuniversity
dc.titleDevelopment of a scanning electron microscope image processing system for testing integrated circuits
dc.title.alternative-
dc.creator.researcherKarkare, Vishakha Gajanan
dc.subject.keywordMicroelectronics today, Digitiser, Image formation system, Edge effect, Simulation of topography
dc.description.noteBibliography p. 184-193
dc.contributor.guideDavid, S K
dc.publisher.placePune
dc.publisher.universitySavitribai Phule Pune University
dc.publisher.institutionDepartment of Electronic Science
dc.date.registeredn.d.
dc.date.completed1989
dc.date.awardedn.d.
dc.format.dimensions-
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Electronic Science

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/01_title.pdfAttached File23.83 kBAdobe PDFView/Open
01_title.pdf23.83 kBAdobe PDFView/Open
/02_certificate.pdf24.05 kBAdobe PDFView/Open
02_certificate.pdf24.05 kBAdobe PDFView/Open
03_gratitude.pdf97.05 kBAdobe PDFView/Open
05_contents.pdf157.44 kBAdobe PDFView/Open
06_chapter 1.pdf3.92 MBAdobe PDFView/Open
07_chapter 2.pdf3.37 MBAdobe PDFView/Open
08_chapter 3.pdf4.1 MBAdobe PDFView/Open
09_chapter 4.pdf2.82 MBAdobe PDFView/Open
10_chapter 5.pdf7.74 MBAdobe PDFView/Open
11_chapter 6.pdf27.33 MBAdobe PDFView/Open
12_summary.pdf3.42 MBAdobe PDFView/Open
13_references.pdf5.63 MBAdobe PDFView/Open


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