Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/133533
Title: | Development of a scanning electron microscope image processing system for testing integrated circuits |
Researcher: | Karkare, Vishakha Gajanan |
Guide(s): | David, S K |
Keywords: | Microelectronics today, Digitiser, Image formation system, Edge effect, Simulation of topography |
University: | Savitribai Phule Pune University |
Completed Date: | 1989 |
Abstract: | Abstract not available newline newline |
Pagination: | 193p. |
URI: | http://hdl.handle.net/10603/133533 |
Appears in Departments: | Department of Electronic Science |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
/01_title.pdf | Attached File | 23.83 kB | Adobe PDF | View/Open |
01_title.pdf | 23.83 kB | Adobe PDF | View/Open | |
/02_certificate.pdf | 24.05 kB | Adobe PDF | View/Open | |
02_certificate.pdf | 24.05 kB | Adobe PDF | View/Open | |
03_gratitude.pdf | 97.05 kB | Adobe PDF | View/Open | |
05_contents.pdf | 157.44 kB | Adobe PDF | View/Open | |
06_chapter 1.pdf | 3.92 MB | Adobe PDF | View/Open | |
07_chapter 2.pdf | 3.37 MB | Adobe PDF | View/Open | |
08_chapter 3.pdf | 4.1 MB | Adobe PDF | View/Open | |
09_chapter 4.pdf | 2.82 MB | Adobe PDF | View/Open | |
10_chapter 5.pdf | 7.74 MB | Adobe PDF | View/Open | |
11_chapter 6.pdf | 27.33 MB | Adobe PDF | View/Open | |
12_summary.pdf | 3.42 MB | Adobe PDF | View/Open | |
13_references.pdf | 5.63 MB | Adobe PDF | View/Open |
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