Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/133533
Title: Development of a scanning electron microscope image processing system for testing integrated circuits
Researcher: Karkare, Vishakha Gajanan
Guide(s): David, S K
Keywords: Microelectronics today, Digitiser, Image formation system, Edge effect, Simulation of topography
University: Savitribai Phule Pune University
Completed Date: 1989
Abstract: Abstract not available newline newline
Pagination: 193p.
URI: http://hdl.handle.net/10603/133533
Appears in Departments:Department of Electronic Science

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01_title.pdf23.83 kBAdobe PDFView/Open
/02_certificate.pdf24.05 kBAdobe PDFView/Open
02_certificate.pdf24.05 kBAdobe PDFView/Open
03_gratitude.pdf97.05 kBAdobe PDFView/Open
05_contents.pdf157.44 kBAdobe PDFView/Open
06_chapter 1.pdf3.92 MBAdobe PDFView/Open
07_chapter 2.pdf3.37 MBAdobe PDFView/Open
08_chapter 3.pdf4.1 MBAdobe PDFView/Open
09_chapter 4.pdf2.82 MBAdobe PDFView/Open
10_chapter 5.pdf7.74 MBAdobe PDFView/Open
11_chapter 6.pdf27.33 MBAdobe PDFView/Open
12_summary.pdf3.42 MBAdobe PDFView/Open
13_references.pdf5.63 MBAdobe PDFView/Open
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