Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/126349
Title: Investigations of Ge_Si and In_Si interfaces
Researcher: Lobo, Arun
Guide(s): Kulkarni, S K
Keywords: Photoelectron spectroscopy, SEM and AFM analysis, Auger electron spectroscopy, Nucleation and growth, Surface reconstructions
University: Savitribai Phule Pune University
Completed Date: 2000
Abstract: Abstract not available newline newline
Pagination: iii, 172p.
URI: http://hdl.handle.net/10603/126349
Appears in Departments:Department of Physics

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01_title.pdf19.65 kBAdobe PDFView/Open
/02_certificate.pdf26.83 kBAdobe PDFView/Open
02_certificate.pdf26.83 kBAdobe PDFView/Open
03_acknowledgement.pdf89.38 kBAdobe PDFView/Open
04_contents.pdf83.13 kBAdobe PDFView/Open
05_list of acronyms.pdf37.95 kBAdobe PDFView/Open
06_list of symbol.pdf48.67 kBAdobe PDFView/Open
07_preface.pdf141.26 kBAdobe PDFView/Open
08_chapter 1.pdf7.72 MBAdobe PDFView/Open
09_chapter 2.pdf2.76 MBAdobe PDFView/Open
10_chapter 3.pdf6.28 MBAdobe PDFView/Open
11_chapter 4.pdf2.4 MBAdobe PDFView/Open
12_chapter 5.pdf226.56 kBAdobe PDFView/Open
13_list of publications.pdf72.28 kBAdobe PDFView/Open
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