Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/126149
Title: Studies on radiation induced defects in semiconductor devices
Researcher: Sanjay Bhave, Priyashree
Guide(s): Bhoraskar, V N
Keywords: Gamma rays, Electron source, Heavy ion, Irradiation, Cryostat
University: Savitribai Phule Pune University
Completed Date: 1996
Abstract: Abstract not available newline newline
Pagination: 76P.
URI: http://hdl.handle.net/10603/126149
Appears in Departments:Department of Physics

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03_contents.pdf93.79 kBAdobe PDFView/Open
/04_acknowledgement.pdf57.58 kBAdobe PDFView/Open
04_acknowledgement.pdf57.58 kBAdobe PDFView/Open
05_chapter 1.pdf1.38 MBAdobe PDFView/Open
06_chapter 2.pdf1.04 MBAdobe PDFView/Open
07_chapter 3.pdf1.41 MBAdobe PDFView/Open
08_chapter 4.pdf1.5 MBAdobe PDFView/Open
09_chapter 5.pdf1.15 MBAdobe PDFView/Open
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