Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/126052
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dc.coverage.spatialPhysics-
dc.date.accessioned2017-01-24T05:27:17Z-
dc.date.available2017-01-24T05:27:17Z-
dc.identifier.urihttp://hdl.handle.net/10603/126052-
dc.description.abstractAbstract not available newline newline-
dc.format.extentii, 129P.-
dc.languageEnglish-
dc.relation--
dc.rightsuniversity-
dc.titleFormation and characterization of some metal _ semiconductor interfaces-
dc.title.alternative--
dc.creator.researcherGokhale, Shubha Mukund-
dc.subject.keywordMechanism of schottky, Chemical aspects, Capacitance-voltage, Photoelectron measurement, XPS analysis-
dc.description.note--
dc.contributor.guideKulkarni, S K-
dc.publisher.placePune-
dc.publisher.universitySavitribai Phule Pune University-
dc.publisher.institutionDepartment of Physics-
dc.date.registeredn.d.-
dc.date.completedn.d-
dc.date.awardedn.d.-
dc.format.dimensions--
dc.format.accompanyingmaterialNone-
dc.source.universityUniversity-
dc.type.degreePh.D.-
Appears in Departments:Department of Physics

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/01_title.pdfAttached File19.9 kBAdobe PDFView/Open
01_title.pdf19.9 kBAdobe PDFView/Open
/02_certificate.pdf24.56 kBAdobe PDFView/Open
02_certificate.pdf24.56 kBAdobe PDFView/Open
03_contents.pdf75.92 kBAdobe PDFView/Open
04_list of acronyms.pdf23.91 kBAdobe PDFView/Open
05_list of symbols.pdf69.94 kBAdobe PDFView/Open
06_preface.pdf99.34 kBAdobe PDFView/Open
/07_chapter 1.pdf1.68 MBAdobe PDFView/Open
07_chapter 1.pdf1.68 MBAdobe PDFView/Open
/08_chapter 2.pdf3.61 MBAdobe PDFView/Open
08_chapter 2.pdf3.61 MBAdobe PDFView/Open
/09_chapter 3.pdf804.11 kBAdobe PDFView/Open
09_chapter 3.pdf804.11 kBAdobe PDFView/Open
/10_chapter 4.pdf4.92 MBAdobe PDFView/Open
10_chapter 4.pdf4.92 MBAdobe PDFView/Open
11_summary.pdf138.6 kBAdobe PDFView/Open
12_acknowledgement.pdf57.59 kBAdobe PDFView/Open
13_list of publications.pdf33.63 kBAdobe PDFView/Open


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