Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/126052
Title: Formation and characterization of some metal _ semiconductor interfaces
Researcher: Gokhale, Shubha Mukund
Guide(s): Kulkarni, S K
Keywords: Mechanism of schottky, Chemical aspects, Capacitance-voltage, Photoelectron measurement, XPS analysis
University: Savitribai Phule Pune University
Completed Date: n.d
Abstract: Abstract not available newline newline
Pagination: ii, 129P.
URI: http://hdl.handle.net/10603/126052
Appears in Departments:Department of Physics

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/01_title.pdfAttached File19.9 kBAdobe PDFView/Open
01_title.pdf19.9 kBAdobe PDFView/Open
/02_certificate.pdf24.56 kBAdobe PDFView/Open
02_certificate.pdf24.56 kBAdobe PDFView/Open
03_contents.pdf75.92 kBAdobe PDFView/Open
04_list of acronyms.pdf23.91 kBAdobe PDFView/Open
05_list of symbols.pdf69.94 kBAdobe PDFView/Open
06_preface.pdf99.34 kBAdobe PDFView/Open
/07_chapter 1.pdf1.68 MBAdobe PDFView/Open
07_chapter 1.pdf1.68 MBAdobe PDFView/Open
/08_chapter 2.pdf3.61 MBAdobe PDFView/Open
08_chapter 2.pdf3.61 MBAdobe PDFView/Open
/09_chapter 3.pdf804.11 kBAdobe PDFView/Open
09_chapter 3.pdf804.11 kBAdobe PDFView/Open
/10_chapter 4.pdf4.92 MBAdobe PDFView/Open
10_chapter 4.pdf4.92 MBAdobe PDFView/Open
11_summary.pdf138.6 kBAdobe PDFView/Open
12_acknowledgement.pdf57.59 kBAdobe PDFView/Open
13_list of publications.pdf33.63 kBAdobe PDFView/Open
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