Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/125041
Title: X ray studies of the electronic properties of some technologically important semiconductor systems and some ionic solids
Researcher: Israel, S
Guide(s): Saravanan, R
Keywords: Electronic
Ionic
Technologically
X ray
University: Madurai Kamraj University
Completed Date: 2006
Abstract: None
Pagination: 227p.
URI: http://hdl.handle.net/10603/125041
Appears in Departments:Department of Physics

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01_title.pdfAttached File31.37 kBAdobe PDFView/Open
02_declaration.pdf5.83 kBAdobe PDFView/Open
03_certificate.pdf6.18 kBAdobe PDFView/Open
04_dedication.pdf14.43 kBAdobe PDFView/Open
05_acknowledgement.pdf21.05 kBAdobe PDFView/Open
06_content.pdf6.27 kBAdobe PDFView/Open
07_preface.pdf19.65 kBAdobe PDFView/Open
08_cjhapter 1.pdf175.35 kBAdobe PDFView/Open
09_chapter 2.pdf842.08 kBAdobe PDFView/Open
10_chapter 3.pdf171.91 kBAdobe PDFView/Open
11_chapter 4.pdf5.53 MBAdobe PDFView/Open
12_chapter 5.pdf30.14 kBAdobe PDFView/Open
13_appendix.pdf130.26 kBAdobe PDFView/Open
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