Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/11447
Title: | Analytical characterization of technologically important materials using TXRF and EDXRF |
Researcher: | Lenka, Sangita Dhara |
Guide(s): | Aggarwal, S K Misra, N L |
Keywords: | Chemical Sciences Nuclear Energy Energy Dispersive X-Ray Fluorescence Nuclear Industry Nuclear Fuel Total Reflection X-Ray Fluorescence |
Upload Date: | 23-Sep-2013 |
University: | Homi Bhabha National Institute |
Completed Date: | February, 2012 |
Abstract: | None |
Pagination: | 227p. |
URI: | http://hdl.handle.net/10603/11447 |
Appears in Departments: | Department of Chemical Sciences |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 105.25 kB | Adobe PDF | View/Open |
02_certificate & declarations.pdf | 689.77 kB | Adobe PDF | View/Open | |
03_table of contents.pdf | 123.11 kB | Adobe PDF | View/Open | |
04_synopsis.pdf | 480.88 kB | Adobe PDF | View/Open | |
05_list of figures & tables.pdf | 155.36 kB | Adobe PDF | View/Open | |
06_chapter 1.pdf | 414.42 kB | Adobe PDF | View/Open | |
07_chapter 2.pdf | 2.5 MB | Adobe PDF | View/Open | |
08_chapter 3.pdf | 407.32 kB | Adobe PDF | View/Open | |
09_chapter 4.pdf | 457.34 kB | Adobe PDF | View/Open | |
10_chapter 5.pdf | 453.92 kB | Adobe PDF | View/Open | |
11_chapter 6.pdf | 364.89 kB | Adobe PDF | View/Open | |
12_chapter 7.pdf | 479.66 kB | Adobe PDF | View/Open | |
13_summary.pdf | 146.93 kB | Adobe PDF | View/Open | |
14_list of publications.pdf | 188.37 kB | Adobe PDF | View/Open |
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