Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/11447
Title: Analytical characterization of technologically important materials using TXRF and EDXRF
Researcher: Lenka, Sangita Dhara
Guide(s): Aggarwal, S K
Misra, N L
Keywords: Chemical Sciences
Nuclear Energy
Energy Dispersive X-Ray Fluorescence
Nuclear Industry
Nuclear Fuel
Total Reflection X-Ray Fluorescence
Upload Date: 23-Sep-2013
University: Homi Bhabha National Institute
Completed Date: February, 2012
Abstract: None
Pagination: 227p.
URI: http://hdl.handle.net/10603/11447
Appears in Departments:Department of Chemical Sciences

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01_title.pdfAttached File105.25 kBAdobe PDFView/Open
02_certificate & declarations.pdf689.77 kBAdobe PDFView/Open
03_table of contents.pdf123.11 kBAdobe PDFView/Open
04_synopsis.pdf480.88 kBAdobe PDFView/Open
05_list of figures & tables.pdf155.36 kBAdobe PDFView/Open
06_chapter 1.pdf414.42 kBAdobe PDFView/Open
07_chapter 2.pdf2.5 MBAdobe PDFView/Open
08_chapter 3.pdf407.32 kBAdobe PDFView/Open
09_chapter 4.pdf457.34 kBAdobe PDFView/Open
10_chapter 5.pdf453.92 kBAdobe PDFView/Open
11_chapter 6.pdf364.89 kBAdobe PDFView/Open
12_chapter 7.pdf479.66 kBAdobe PDFView/Open
13_summary.pdf146.93 kBAdobe PDFView/Open
14_list of publications.pdf188.37 kBAdobe PDFView/Open
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