Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/107549
Title: Studies on electronic speckle pattern interferometry ESPI for non destructive evaluation
Researcher: Mujeeb A
Guide(s): Unnikrishnan Nayar V; Ravindran V R
Keywords: Optoelectronics
University: University of Kerala
Completed Date: 21/07/2006
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/107549
Appears in Departments:Department of Optoelectronics

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