Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/107549
Title: | Studies on electronic speckle pattern interferometry ESPI for non destructive evaluation |
Researcher: | Mujeeb A |
Guide(s): | Unnikrishnan Nayar V; Ravindran V R |
Keywords: | Optoelectronics |
University: | University of Kerala |
Completed Date: | 21/07/2006 |
Abstract: | newline |
Pagination: | |
URI: | http://hdl.handle.net/10603/107549 |
Appears in Departments: | Department of Optoelectronics |
Files in This Item:
File | Description | Size | Format | |
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01_title.pdf | Attached File | 20.14 kB | Adobe PDF | View/Open |
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