1. Shodhganga@INFLIBNET
  2. University of Kerala
  3. Department of Optoelectronics
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/107544
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DC FieldValueLanguage
dc.coverage.spatial
dc.date.accessioned2016-08-19T11:48:00Z-
dc.date.available2016-08-19T11:48:00Z-
dc.identifier.urihttp://hdl.handle.net/10603/107544-
dc.description.abstractnewline
dc.format.extent
dc.languageEnglish
dc.relation
dc.rightsuniversity
dc.titleStudies on electronic speckle pattern interferometry ESPI for non destructive evaluation
dc.title.alternative
dc.creator.researcherMujeeb A
dc.subject.keywordOptoelectronics
dc.description.note
dc.contributor.guideUnnikrishnan Nayar V; Ravindran V R
dc.publisher.placeThiruvananthapuram
dc.publisher.universityUniversity of Kerala
dc.publisher.institutionDepartment of Optoelectronics
dc.date.registered21/07/2002
dc.date.completed21/07/2006
dc.date.awarded
dc.format.dimensions
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Optoelectronics

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File20.14 kBAdobe PDFView/Open
02_certificate & declaration.pdf52.81 kBAdobe PDFView/Open
03_contents.pdf66.48 kBAdobe PDFView/Open
04_acknowledgement.pdf75.09 kBAdobe PDFView/Open
05_preface.pdf120.61 kBAdobe PDFView/Open
06_list of publications.pdf71.98 kBAdobe PDFView/Open
07_chapter 1.pdf1.11 MBAdobe PDFView/Open
08_chapter 2.pdf785.73 kBAdobe PDFView/Open
09_chapter 3.pdf3.73 MBAdobe PDFView/Open
10_chapter 4.pdf3.85 MBAdobe PDFView/Open
11_chapter 5.pdf2.12 MBAdobe PDFView/Open
12_chapter 6.pdf121.73 kBAdobe PDFView/Open
13_appendices.pdf188.72 kBAdobe PDFView/Open
14_references.pdf446.45 kBAdobe PDFView/Open
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