Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/107544
Title: Studies on electronic speckle pattern interferometry ESPI for non destructive evaluation
Researcher: Mujeeb A
Guide(s): Unnikrishnan Nayar V; Ravindran V R
Keywords: Optoelectronics
University: University of Kerala
Completed Date: 21/07/2006
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/107544
Appears in Departments:Department of Optoelectronics

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01_title.pdfAttached File20.14 kBAdobe PDFView/Open
02_certificate & declaration.pdf52.81 kBAdobe PDFView/Open
03_contents.pdf66.48 kBAdobe PDFView/Open
04_acknowledgement.pdf75.09 kBAdobe PDFView/Open
05_preface.pdf120.61 kBAdobe PDFView/Open
06_list of publications.pdf71.98 kBAdobe PDFView/Open
07_chapter 1.pdf1.11 MBAdobe PDFView/Open
08_chapter 2.pdf785.73 kBAdobe PDFView/Open
09_chapter 3.pdf3.73 MBAdobe PDFView/Open
10_chapter 4.pdf3.85 MBAdobe PDFView/Open
11_chapter 5.pdf2.12 MBAdobe PDFView/Open
12_chapter 6.pdf121.73 kBAdobe PDFView/Open
13_appendices.pdf188.72 kBAdobe PDFView/Open
14_references.pdf446.45 kBAdobe PDFView/Open
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