Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/107544
Title: | Studies on electronic speckle pattern interferometry ESPI for non destructive evaluation |
Researcher: | Mujeeb A |
Guide(s): | Unnikrishnan Nayar V; Ravindran V R |
Keywords: | Optoelectronics |
University: | University of Kerala |
Completed Date: | 21/07/2006 |
Abstract: | newline |
Pagination: | |
URI: | http://hdl.handle.net/10603/107544 |
Appears in Departments: | Department of Optoelectronics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 20.14 kB | Adobe PDF | View/Open |
02_certificate & declaration.pdf | 52.81 kB | Adobe PDF | View/Open | |
03_contents.pdf | 66.48 kB | Adobe PDF | View/Open | |
04_acknowledgement.pdf | 75.09 kB | Adobe PDF | View/Open | |
05_preface.pdf | 120.61 kB | Adobe PDF | View/Open | |
06_list of publications.pdf | 71.98 kB | Adobe PDF | View/Open | |
07_chapter 1.pdf | 1.11 MB | Adobe PDF | View/Open | |
08_chapter 2.pdf | 785.73 kB | Adobe PDF | View/Open | |
09_chapter 3.pdf | 3.73 MB | Adobe PDF | View/Open | |
10_chapter 4.pdf | 3.85 MB | Adobe PDF | View/Open | |
11_chapter 5.pdf | 2.12 MB | Adobe PDF | View/Open | |
12_chapter 6.pdf | 121.73 kB | Adobe PDF | View/Open | |
13_appendices.pdf | 188.72 kB | Adobe PDF | View/Open | |
14_references.pdf | 446.45 kB | Adobe PDF | View/Open |
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