Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/106828
Title: | Design And Selection Of Continuous sampling Plans For Attribute Inspection |
Researcher: | D. Venkataramana |
Guide(s): | Prof. M. Venkataramanaiah |
University: | Sri Venkateswara University |
Completed Date: | |
Abstract: | newline |
Pagination: | |
URI: | http://hdl.handle.net/10603/106828 |
Appears in Departments: | Department of Statistics |
Files in This Item:
File | Description | Size | Format | |
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01_title.pdf | Attached File | 213.58 kB | Adobe PDF | View/Open |
02_declaration.pdf | 73.6 kB | Adobe PDF | View/Open | |
03_certificate.pdf | 123.96 kB | Adobe PDF | View/Open | |
04_ackowledgements.pdf | 138.36 kB | Adobe PDF | View/Open | |
05_contents.pdf | 56.44 kB | Adobe PDF | View/Open | |
06_abbreviations.pdf | 41.35 kB | Adobe PDF | View/Open | |
07_chapter-i.pdf | 290.28 kB | Adobe PDF | View/Open | |
08_chapter-ii.pdf | 205.79 kB | Adobe PDF | View/Open | |
09_chapter-iii.pdf | 1.28 MB | Adobe PDF | View/Open | |
10_chapter-iv.pdf | 774.04 kB | Adobe PDF | View/Open | |
11_chapter-v.pdf | 53.91 kB | Adobe PDF | View/Open | |
12_bibliography.pdf | 124.96 kB | Adobe PDF | View/Open | |
13_appendix.pdf | 96.2 kB | Adobe PDF | View/Open | |
14_papers published.pdf | 960.27 kB | Adobe PDF | View/Open |
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