Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/106828
Title: Design And Selection Of Continuous sampling Plans For Attribute Inspection
Researcher: D. Venkataramana
Guide(s): Prof. M. Venkataramanaiah
University: Sri Venkateswara University
Completed Date: 
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/106828
Appears in Departments:Department of Statistics

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01_title.pdfAttached File213.58 kBAdobe PDFView/Open
02_declaration.pdf73.6 kBAdobe PDFView/Open
03_certificate.pdf123.96 kBAdobe PDFView/Open
04_ackowledgements.pdf138.36 kBAdobe PDFView/Open
05_contents.pdf56.44 kBAdobe PDFView/Open
06_abbreviations.pdf41.35 kBAdobe PDFView/Open
07_chapter-i.pdf290.28 kBAdobe PDFView/Open
08_chapter-ii.pdf205.79 kBAdobe PDFView/Open
09_chapter-iii.pdf1.28 MBAdobe PDFView/Open
10_chapter-iv.pdf774.04 kBAdobe PDFView/Open
11_chapter-v.pdf53.91 kBAdobe PDFView/Open
12_bibliography.pdf124.96 kBAdobe PDFView/Open
13_appendix.pdf96.2 kBAdobe PDFView/Open
14_papers published.pdf960.27 kBAdobe PDFView/Open
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