Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/102429
Title: | Low Power Testing Techniques for VLSI Modules |
Researcher: | Balwinder Singh |
Guide(s): | Narang, Sukhleen Bindra |
Keywords: | Low Power Testing Techniques VLSI Modules |
University: | Guru Nanak Dev University |
Completed Date: | 04/10/2013 |
Abstract: | newline Available |
Pagination: | 28cm |
URI: | http://hdl.handle.net/10603/102429 |
Appears in Departments: | Department of Electronics Technology |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 62.02 kB | Adobe PDF | View/Open |
02_certificate.pdf | 20.76 kB | Adobe PDF | View/Open | |
03_declaration.pdf | 17.47 kB | Adobe PDF | View/Open | |
04_acknowledgements.pdf | 24.77 kB | Adobe PDF | View/Open | |
05_abstract.pdf | 30.85 kB | Adobe PDF | View/Open | |
06_contents.pdf | 28.54 kB | Adobe PDF | View/Open | |
07_list of figures.pdf | 26.3 kB | Adobe PDF | View/Open | |
08_list of tables.pdf | 20.62 kB | Adobe PDF | View/Open | |
09_abbreviations.pdf | 20.84 kB | Adobe PDF | View/Open | |
10_thesis outcomes.pdf | 26.9 kB | Adobe PDF | View/Open | |
11_chapter 1.pdf | 452.32 kB | Adobe PDF | View/Open | |
12_chapter 2.pdf | 251.83 kB | Adobe PDF | View/Open | |
13_chapter 3.pdf | 2.68 MB | Adobe PDF | View/Open | |
14_chapter 4.pdf | 4.85 MB | Adobe PDF | View/Open | |
15_chapter 5.pdf | 874.86 kB | Adobe PDF | View/Open | |
16_chapter 6.pdf | 36.13 kB | Adobe PDF | View/Open | |
17_references.pdf | 97.3 kB | Adobe PDF | View/Open |
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