Shodhganga : a reservoir of Indian theses @ INFLIBNET
The Shodhganga@INFLIBNET Centre provides a platform for research students to deposit their Ph.D. theses and make it available to the entire scholarly community in open access.
Browsing by Researcher/Guide Shrivastava, Mayank
Showing results 1 to 9 of 9
Upload Date | Title | Researcher | Guide(s) |
22-Dec-2022 | Addressing the Performance and Reliability Bottlenecks in 2D Transition Metal Dichalcogenide TMD Based Transistor Technology | Kuruva, Hemanjaneyulu | Shrivastava, Mayank |
29-Jan-2023 | Atomic level investigation and proposals to address technological roadblocks and reliability challenges in 2d material based nanoelectronic devices | Kumar, Jeevesh | Shrivastava, Mayank |
29-Jan-2023 | Device circuit reliability co design in high voltage and power devices | Variar, Harsha B | Shrivastava, Mayank |
20-Dec-2022 | Disruptive Approaches to Address Performance Reliability Challenges in 2 Dimentional 2D Material Based Transistors Memories | Ansh | Shrivastava, Mayank |
16-Dec-2022 | Electro thermal Transport through Graphene and CNT at Nanosecond Time Scales and its Implications on Device Reliability | Mishtra, Abhishek | Shrivastava, Mayank |
30-Dec-2022 | ESD Reliability Physics and Reliability Aware Design of Advanced High Voltage CMOS Beyond CMOS Devices | Kranthi, Nagothu Karmel | Shrivastava, Mayank |
31-Jan-2023 | Physics based approach for efficient and reliable enhancement mode algan or gan high electron mobility transistor hemt technology | Dutta Gupta, Sayak | Shrivastava, Mayank |
21-Dec-2022 | Physics Based Design and Development of Gallium Nitride High Electron Mobility Transistors HEMTs and Schottky Barrier Diodes for Power and RF Applications | Soni, Ankit | Shrivastava, Mayank |
24-Dec-2022 | Safe Operating Area Reliability of AlGaN GaN High Electron Mobility Transistors HEMTs | Shankar, Bhawani | Shrivastava, Mayank |