Browsing by Researcher/Guide Shrivastava, Mayank

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
or enter first few letters:  
Showing results 1 to 9 of 9
Upload DateTitleResearcherGuide(s)
22-Dec-2022Addressing the Performance and Reliability Bottlenecks in 2D Transition Metal Dichalcogenide TMD Based Transistor TechnologyKuruva, HemanjaneyuluShrivastava, Mayank
29-Jan-2023Atomic level investigation and proposals to address technological roadblocks and reliability challenges in 2d material based nanoelectronic devicesKumar, JeeveshShrivastava, Mayank
29-Jan-2023Device circuit reliability co design in high voltage and power devicesVariar, Harsha BShrivastava, Mayank
20-Dec-2022Disruptive Approaches to Address Performance Reliability Challenges in 2 Dimentional 2D Material Based Transistors MemoriesAnshShrivastava, Mayank
16-Dec-2022Electro thermal Transport through Graphene and CNT at Nanosecond Time Scales and its Implications on Device ReliabilityMishtra, AbhishekShrivastava, Mayank
30-Dec-2022ESD Reliability Physics and Reliability Aware Design of Advanced High Voltage CMOS Beyond CMOS DevicesKranthi, Nagothu KarmelShrivastava, Mayank
31-Jan-2023Physics based approach for efficient and reliable enhancement mode algan or gan high electron mobility transistor hemt technologyDutta Gupta, SayakShrivastava, Mayank
21-Dec-2022Physics Based Design and Development of Gallium Nitride High Electron Mobility Transistors HEMTs and Schottky Barrier Diodes for Power and RF ApplicationsSoni, AnkitShrivastava, Mayank
24-Dec-2022Safe Operating Area Reliability of AlGaN GaN High Electron Mobility Transistors HEMTsShankar, BhawaniShrivastava, Mayank