Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/316662
Title: Studies on K X Ray fluorescence parameters of low and medium Z elements
Researcher: Anand L, Francis Maria
Guide(s): Gudennavar, Shivappa B
Keywords: Optics
Physical Sciences
Physics
University: CHRIST University
Completed Date: 2018
Abstract: K X-ray fluorescence parameters for pure elements have been determined using different single and double reflection geometry by several researchers over the years. Horakeri et al.have shown that the K X-ray fluorescence parameters can also be determined by a simple 2and#960;-geometrical configuration method and a NaI(Tl) detector spectrometer for high Z elements. newlineHowever, in order to study the K XRF parameters for low Z elements, high resolution detector spectrometers are required.But in high resolution detectors like HPGe and Si(Li), due to the gap between window and the active area of the detector, the solid angle subtended by the detector at the target is not 2and#960;. Hence a suitable geometry correction is required for accurate newlinemeasurement of incident photons and the emitted K X-ray photons in order to determine the K XRF parameters in low Z elements. In the present study, employing a nearly 2and#960;-geometrical configuration and applying suitable geometry correction, we have determined the K X-ray fluorescence parameters of a few low and medium Z elements in the range of 27 and#8804; Z and#8804; 30 and 42 and#8804; Z and#8804; 47 respectively. The elements were procured in the form of thin foils and were irradiated by a weak radioactive source. The emitted K X-ray photons were detected using a low energy high resolution HPGe detector spectrometer. The incident photons, emitted K X-ray photons and the transmitted photons at newlinethe incident energy is measured and were corrected for window attenuation, efficiency, self-attenuation and geometry correction newlineto obtain the true intensities of incident photons, emitted K Xray photons and the transmitted photons at the incident energy.
Pagination: x,149p.
URI: http://hdl.handle.net/10603/316662
Appears in Departments:Department of Physics and Electronics

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02_dedication.pdf9.17 kBAdobe PDFView/Open
03_declaration.pdf210.17 kBAdobe PDFView/Open
04_certificate.pdf642.51 kBAdobe PDFView/Open
05_abstract.pdf129.74 kBAdobe PDFView/Open
06_acknowledgements.pdf70.65 kBAdobe PDFView/Open
07_contents.pdf54.98 kBAdobe PDFView/Open
08_list_of_tables.pdf99.72 kBAdobe PDFView/Open
09_list_of_figures.pdf86.85 kBAdobe PDFView/Open
10_list_of_symbols_and_abbreviations.pdf36.59 kBAdobe PDFView/Open
11_chapter1.pdf431.86 kBAdobe PDFView/Open
12_chapter2.pdf1.37 MBAdobe PDFView/Open
13_chapter3.pdf1.58 MBAdobe PDFView/Open
14_chapter4.pdf1.45 MBAdobe PDFView/Open
15_chapter5.pdf1.23 MBAdobe PDFView/Open
16_bibliography.pdf542.21 kBAdobe PDFView/Open
17_publications_and_proceedings.pdf121.12 kBAdobe PDFView/Open
18_appendix.pdf976.64 kBAdobe PDFView/Open
80_recommendation.pdf1.32 MBAdobe PDFView/Open
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