Please use this identifier to cite or link to this item:
Title: Methodologies for testing and Locating Faults in Integrated Circuits
Researcher: Khade R. H.
Guide(s): Chaudhari, D. S.
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: North Maharashtra University
Completed Date: 
Abstract: newline
Appears in Departments:Department of Electronics Engineering and Technology

Files in This Item:
File Description SizeFormat 
80_recommendation.pdfAttached File204.48 kBAdobe PDFView/Open
a1-cover page.pdf6.12 kBAdobe PDFView/Open
abstract and content and others.pdf2.28 MBAdobe PDFView/Open
appendix_a.pdf219.95 kBAdobe PDFView/Open
appendix_b.pdf164.78 kBAdobe PDFView/Open
appendix_c.pdf219.6 kBAdobe PDFView/Open
appendix_d.pdf134.8 kBAdobe PDFView/Open
chapter1.pdf170.9 kBAdobe PDFView/Open
chapter2.pdf504.76 kBAdobe PDFView/Open
chapter3.pdf1.7 MBAdobe PDFView/Open
chapter4.pdf377.62 kBAdobe PDFView/Open
chapter5.pdf205.52 kBAdobe PDFView/Open

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