Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/79579
Title: Multilayer film deposition characterization by reflectometry techniques and their structure property correlation
Researcher: Swain, Mitali
Guide(s): Basu, Saibal
Keywords: Correlation
Film deposition
Multilayer
Reflectometry
University: Homi Bhabha National Institute
Completed Date: 2015
Abstract: Abstract available
Pagination: 142p.
URI: http://hdl.handle.net/10603/79579
Appears in Departments:Department of Physical Sciences

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01_title.pdfAttached File141.31 kBAdobe PDFView/Open
02_certificate.pdf341.46 kBAdobe PDFView/Open
03_declaration.pdf368.33 kBAdobe PDFView/Open
04_publication.pdf209.21 kBAdobe PDFView/Open
05_dedication.pdf119.91 kBAdobe PDFView/Open
06_acknowledgement.pdf123.67 kBAdobe PDFView/Open
07_abstract.pdf144.22 kBAdobe PDFView/Open
08_contents.pdf230.02 kBAdobe PDFView/Open
09_synopsis.pdf224.56 kBAdobe PDFView/Open
10_list of figures and tables.pdf310.88 kBAdobe PDFView/Open
11_chapter 1.pdf1.01 MBAdobe PDFView/Open
12_chapter 2.pdf1.02 MBAdobe PDFView/Open
13_chapter 3.pdf1.29 MBAdobe PDFView/Open
14_chapter 4.pdf2.36 MBAdobe PDFView/Open
15_chapter 5.pdf874.24 kBAdobe PDFView/Open
16_chapter 6.pdf220.48 kBAdobe PDFView/Open
17_references.pdf297.35 kBAdobe PDFView/Open


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