Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/79567
Title: Defect characterization in aisi 316 l ss using pulsed and lock in thermography
Researcher: Sharath D
Guide(s): Mudali, U Kamachi
Keywords: aisi 316 l ss
Defect characterization
thermography
University: Homi Bhabha National Institute
Completed Date: 2014
Abstract: Available abstract
Pagination: 156 p.
URI: http://hdl.handle.net/10603/79567
Appears in Departments:Department of Engineering Sciences

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01_title.pdfAttached File66.69 kBAdobe PDFView/Open
02_abstract.pdf13.83 kBAdobe PDFView/Open
03_certificate.pdf722.15 kBAdobe PDFView/Open
04_statement.pdf493.17 kBAdobe PDFView/Open
05_declaration.pdf314.95 kBAdobe PDFView/Open
06_publication.pdf533.63 kBAdobe PDFView/Open
07_acknowledgement.pdf792.71 kBAdobe PDFView/Open
08_contents.pdf56.94 kBAdobe PDFView/Open
09_synopsis.pdf81.97 kBAdobe PDFView/Open
10_figure.pdf59.53 kBAdobe PDFView/Open
11_chapter 1.pdf664.6 kBAdobe PDFView/Open
12_chapter 2.pdf891.66 kBAdobe PDFView/Open
13_chapter 3.pdf1.22 MBAdobe PDFView/Open
14_chapter 4.pdf1.65 MBAdobe PDFView/Open
15_chapter 5.pdf4.65 MBAdobe PDFView/Open
16_chapter 6.pdf70.47 kBAdobe PDFView/Open
17_references.pdf102.1 kBAdobe PDFView/Open
18_publication.pdf257.74 kBAdobe PDFView/Open


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