Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/77205
Title: Structural analysis of as grown implanted LEC GaAs single crystals and CBE growth and ECV profiling of InGaAs P InP AIInAs InP and multi quantum well structures
Researcher: Udhayasankar, M
Guide(s): Kumar, J
Keywords: Czochralski
Semiconductor
Photoluminescence
Beryllium
Microhardness
University: Anna University
Completed Date: 30/09/1999
Abstract: Abstract available
Pagination: xxv, 203p.
URI: http://hdl.handle.net/10603/77205
Appears in Departments:Faculty of Science and Humanities

Files in This Item:
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01_title page.pdfAttached File21.05 kBAdobe PDFView/Open
02_certificate.pdf24.73 kBAdobe PDFView/Open
03_abstract.pdf165.11 kBAdobe PDFView/Open
04_acknowledgement.pdf49.74 kBAdobe PDFView/Open
05_table of contents.pdf103.31 kBAdobe PDFView/Open
06_list of table.pdf23.63 kBAdobe PDFView/Open
07_list of figures.pdf210.65 kBAdobe PDFView/Open
08_list of symbols abbreviations and nomenclatures.pdf129.7 kBAdobe PDFView/Open
09_chapter 1.pdf2.58 MBAdobe PDFView/Open
10_chapter 2.pdf557.21 kBAdobe PDFView/Open
11_chapter 3.pdf1.71 MBAdobe PDFView/Open
12_chapter 4.pdf2.49 MBAdobe PDFView/Open
13_chapter 5.pdf1.06 MBAdobe PDFView/Open
14_chapter 6.pdf3.86 MBAdobe PDFView/Open
15_summary and suggestions for future work.pdf275.97 kBAdobe PDFView/Open
16_references.pdf840.59 kBAdobe PDFView/Open
17_vitae.pdf49.81 kBAdobe PDFView/Open
18_list of publications.pdf252.61 kBAdobe PDFView/Open


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