Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/74475
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DC FieldValueLanguage
dc.coverage.spatialPhysics
dc.date.accessioned2016-03-04T11:56:46Z-
dc.date.available2016-03-04T11:56:46Z-
dc.identifier.urihttp://hdl.handle.net/10603/74475-
dc.description.abstractNone
dc.format.extent139p.
dc.languageEnglish
dc.relation-
dc.rightsuniversity
dc.titleStudies in semiconductor electronics development of computer controlled deep level transient spectroscopy dlts system and transient capacitance studies of some deep impurities in silicon
dc.title.alternative-
dc.creator.researcherPandu Rangaiah, S V
dc.subject.keywordComputer
dc.subject.keywordDevelopment
dc.subject.keywordElectronics
dc.description.noteReferences given
dc.contributor.guideReddy, Narasimha P
dc.publisher.placeTirupati
dc.publisher.universitySri Venkateswara University
dc.publisher.institutionDepartment of Physics
dc.date.registeredn.d.
dc.date.completed1994
dc.date.awardedn.d.
dc.format.dimensions-
dc.format.accompanyingmaterialNone
dc.type.degreePh.D.
dc.source.inflibnetINFLIBNET
Appears in Departments:Department of Physics

Files in This Item:
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01_title.pdfAttached File503.14 kBAdobe PDFView/Open
02_certificate.pdf503.14 kBAdobe PDFView/Open
03_declaration.pdf503.13 kBAdobe PDFView/Open
04_acknowledgements.pdf502.92 kBAdobe PDFView/Open
05_contents.pdf502.81 kBAdobe PDFView/Open
06_preface.pdf506.79 kBAdobe PDFView/Open
07_chapter 1.pdf958.27 kBAdobe PDFView/Open
08_chapter 2.pdf2.37 MBAdobe PDFView/Open
09_chapter 3.pdf1.44 MBAdobe PDFView/Open
10_chapter 4.pdf967.53 kBAdobe PDFView/Open
11_chapter 5.pdf177.57 kBAdobe PDFView/Open
12_references.pdf503.14 kBAdobe PDFView/Open


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