Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/74475
Title: Studies in semiconductor electronics development of computer controlled deep level transient spectroscopy dlts system and transient capacitance studies of some deep impurities in silicon
Researcher: Pandu Rangaiah, S V
Guide(s): Reddy, Narasimha P
Keywords: Computer
Development
Electronics
University: Sri Venkateswara University
Completed Date: 1994
Abstract: None
Pagination: 139p.
URI: http://hdl.handle.net/10603/74475
Appears in Departments:Department of Physics

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File503.14 kBAdobe PDFView/Open
02_certificate.pdf503.14 kBAdobe PDFView/Open
03_declaration.pdf503.13 kBAdobe PDFView/Open
04_acknowledgements.pdf502.92 kBAdobe PDFView/Open
05_contents.pdf502.81 kBAdobe PDFView/Open
06_preface.pdf506.79 kBAdobe PDFView/Open
07_chapter 1.pdf958.27 kBAdobe PDFView/Open
08_chapter 2.pdf2.37 MBAdobe PDFView/Open
09_chapter 3.pdf1.44 MBAdobe PDFView/Open
10_chapter 4.pdf967.53 kBAdobe PDFView/Open
11_chapter 5.pdf177.57 kBAdobe PDFView/Open
12_references.pdf503.14 kBAdobe PDFView/Open


Items in Shodhganga are protected by copyright, with all rights reserved, unless otherwise indicated.