Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/68973
Title: Micro computer based paper thickness gauge through opacity measurements
Researcher: Veerabhadrappa,C.
Guide(s): Khan,V. Hyder
Keywords: Micro-Computer
Paper
Thickness
Gauge
Measurements
University: Sri Krishnadevaraya University
Completed Date: 31/12/1992
Abstract: Abstract not available
Pagination: xi, 53p.
URI: http://hdl.handle.net/10603/68973
Appears in Departments:Department of Physics

Files in This Item:
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01_title page.pdfAttached File16.15 kBAdobe PDFView/Open
02_dedicated.pdf37.33 kBAdobe PDFView/Open
03_declaration.pdf10.49 kBAdobe PDFView/Open
04_certificate.pdf18.5 kBAdobe PDFView/Open
05_content.pdf31.51 kBAdobe PDFView/Open
06_acknowledgement.pdf49.49 kBAdobe PDFView/Open
07_general summary.pdf26.72 kBAdobe PDFView/Open
08_chapter 1.pdf98.7 kBAdobe PDFView/Open
09_chapter 2.pdf172.69 kBAdobe PDFView/Open
10_chapter 3.pdf303.4 kBAdobe PDFView/Open
11_chapter 4.pdf506.68 kBAdobe PDFView/Open
12_references.pdf51.99 kBAdobe PDFView/Open


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