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Title: A study on optoelectronic properties of thermally evaporated CdSe thin films
Researcher: Sarmah, Kangkan
Guide(s): Das, H L
Keywords: Ambient
University: Gauhati University
Completed Date: 31/12/2008
Abstract: In the present work, an experimental study on structural characterization and some optoelectronic properties of thermally evaporated polycrystalline CdSe thin films under different ambient conditions was carried out. The results incorporated in the thesis are presented in five chapters as detailed below. Chapter-I : General Introduction Chapter-II : Equipments Used and Details of the Experimentals Chapter-III : Structural Characterization of CdSe Thin Films Chapter-IV : Optoelectronic Properties of CdSe Thin Films Chapter-V : Spectral Response, Rise and Decay of Photocurrents and Optical Properties A list of related references is included at the end of each chapter. Chapter - I. General Introduction In this chapter a comprehensive discussion is made regarding importance of CdSe thin films for the fabrication of different optoelectronic devices. Along with CdSe, relevant properties of the other II-VI group of semiconductor compounds are also discussed. A solid thin film is a homogenous material which is formed by atom by atom or molecule by molecule condensation process, whose one dimension is reduced suitably to the order of a few mean free paths of the carriers under consideration. As such thin films cannot support themselves; the condensation of a thin film is made on a suitable solid surface called the substrate. The basic physical properties of a thin film depend upon several factors. The thickness of the films has pronounced importance as far as various physical phenomenons of the films are concerned. If the thickness is comparable to or less than the mean free path of electrical conduction process, diffusion length, effective de-Broglie wavelength etc then thickness plays a key role on different electrical as well as optical processes like electrical conductivity, optical absorption etc. In such thin films the charge carriers invariable suffer surface collisions and thus the surface scattering process becomes a predominant factor. All solid thin films irrespective of their deposition techniques are...
Appears in Departments:Department of Physics

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01_title page.pdfAttached File81.5 kBAdobe PDFView/Open
02_certificate.pdf20.52 kBAdobe PDFView/Open
03_declaration.pdf24.88 kBAdobe PDFView/Open
04_acknowledgement.pdf87.75 kBAdobe PDFView/Open
05_preface.pdf110.96 kBAdobe PDFView/Open
06_content.pdf86.47 kBAdobe PDFView/Open
07_list of figures.pdf313 kBAdobe PDFView/Open
08_list of tables.pdf65.62 kBAdobe PDFView/Open
09_chapter 1.pdf1.45 MBAdobe PDFView/Open
10_chapter 2.pdf2.58 MBAdobe PDFView/Open
11_chapter 3.pdf1.67 MBAdobe PDFView/Open
12_chapter 4.pdf1.5 MBAdobe PDFView/Open
13_chapter 5.pdf1.45 MBAdobe PDFView/Open
14_list of publications and presentations.pdf223.53 kBAdobe PDFView/Open
15_abstract.pdf341.57 kBAdobe PDFView/Open
16_references.pdf26.9 kBAdobe PDFView/Open

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