Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/66104
Title: Design considerations of scanning optical microscope SOM for specific applications of thin films and semiconductor characterization
Researcher: Baruah, Kishor Kumar
Guide(s): Choudhury, A
Keywords: Amplifier
Electron-Hole
Films
Hardware
Microscope
Semiconductor
Synchronism
Topographic
University: Gauhati University
Completed Date: 31/10/1999
Abstract: Abstract not available
Pagination: 
URI: http://hdl.handle.net/10603/66104
Appears in Departments:Department of Physics

Files in This Item:
File Description SizeFormat 
01_title page.pdfAttached File21.25 kBAdobe PDFView/Open
02_declaration.pdf15.54 kBAdobe PDFView/Open
03_certificate.pdf15.57 kBAdobe PDFView/Open
04_preface.pdf18.19 kBAdobe PDFView/Open
05_acknowledgement.pdf25.05 kBAdobe PDFView/Open
06_content.pdf53.17 kBAdobe PDFView/Open
07_chapter 1.pdf351.79 kBAdobe PDFView/Open
08_chapter 2.pdf1.22 MBAdobe PDFView/Open
09_chapter 3.pdf1.33 MBAdobe PDFView/Open
10_chapter 4.pdf1.62 MBAdobe PDFView/Open
11_chapter 5.pdf279.23 kBAdobe PDFView/Open
12_published research papers.pdf30.03 kBAdobe PDFView/Open


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