Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/60477
Title: Breakdown phenomena and evaluation of testing methods under bias voltages
Researcher: Patel,Jashavant J
Guide(s): Panchal,M R
Keywords: Breakdown
Evaluation
Methods
Phenomena
Voltages
University: Maharaja Sayajirao University of Baroda
Completed Date: 31/12/1985
Abstract: Abstract available
Pagination: xxviii, 283p.
URI: http://hdl.handle.net/10603/60477
Appears in Departments:Department of Electrical Engineering

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01_title.pdfAttached File17.47 kBAdobe PDFView/Open
02_dedication.pdf3.6 kBAdobe PDFView/Open
03_certificate.pdf16.67 kBAdobe PDFView/Open
04_abstract.pdf164.33 kBAdobe PDFView/Open
05_content.pdf195.34 kBAdobe PDFView/Open
06_list of tables.pdf35.87 kBAdobe PDFView/Open
07_list of figures.pdf275.32 kBAdobe PDFView/Open
08_nomenclature.pdf82.04 kBAdobe PDFView/Open
09_chapter 1.pdf901.35 kBAdobe PDFView/Open
10_chapter 2.pdf1.8 MBAdobe PDFView/Open
11_chapter 3.pdf3.76 MBAdobe PDFView/Open
12_chapter 4.pdf1.49 MBAdobe PDFView/Open
13_chapter 5.pdf2.16 MBAdobe PDFView/Open
14_chapter 6.pdf1.57 MBAdobe PDFView/Open
15_chapter 7.pdf430.55 kBAdobe PDFView/Open
16_references.pdf689.32 kBAdobe PDFView/Open
17_appendix i.pdf38.61 kBAdobe PDFView/Open
18_acknowledgement.pdf30.41 kBAdobe PDFView/Open
19_resume.pdf41.06 kBAdobe PDFView/Open


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