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Title: Efficient methods and novel approaches for analog electronic circuitEfficient methods and novel approaches for analog electronic circuit fault diagnosis using simulation before test (SBT) approach
Researcher: Rao, S P Venu Madhava
Guide(s): Sarat Chandra Babu, N
Lal Kishore, K
Keywords: Electrical Fault
Electronics Engineering
Upload Date: 3-Sep-2012
University: Jawaharlal Nehru Technological University
Completed Date: October, 2011
Abstract: The fault diagnosis of analog circuits has been a major field of interest in research for the last few decades. The proliferation of large analog circuits and systems of ever increasing complexity has stirred great interest in methods for trouble shooting or fault diagnosis of analog circuits. The problem of analog fault diagnosis is all the more important because of the growing usage of mixed mode analog/digital integrated circuits. The fault diagnosis of analog circuits is complex and slow, because of the inherent problems associated with the analog circuits. Some of these are the continuum of failures and tolerances of the components used in the circuit. Thus there is a need for devising new methods and approaches in analog fault diagnosis. Fault dictionary is one of the popular approaches in analog fault diagnosis. This method consists of different phases like fault dictionary construction, selection of test nodes, selection of test frequencies and fault isolation. This thesis is concerned with study of these methods in analog fault diagnosis. In this thesis new methods are presented which belong to the multi frequency approach of analog fault diagnosis. Integer coded fault dictionary of ambiguity sets is used to construct the ambiguity table. The entries of the fault dictionary are an indication of the ambiguity set to which the fault belongs. The entries of this table give the total number of ambiguity sets present in a particular fault, for a chosen set of test frequency. Unique integer numbers in the ambiguity table are called singletons. The singletons indicate the number of faults that can be isolated for a particular frequency. More number of singletons means, more number of faults which can be isolated. In cases where a test frequency f is unable to isolate all the faults, a combination of f with another frequency f? that has next highest number of singletons is used to isolate more number of faults.
Pagination: 167p.
Appears in Departments:Department of Electronics and Communication Engineering

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01_title.pdfAttached File40.6 kBAdobe PDFView/Open
02_declaration.pdf93.8 kBAdobe PDFView/Open
03_certificate.pdf68.45 kBAdobe PDFView/Open
04_dedication.pdf67.84 kBAdobe PDFView/Open
05_acknowledgements.pdf68.08 kBAdobe PDFView/Open
06_contents.pdf117.58 kBAdobe PDFView/Open
07_abstract.pdf108.56 kBAdobe PDFView/Open
08_list of figures.pdf140 kBAdobe PDFView/Open
09_list of tables.pdf129.85 kBAdobe PDFView/Open
10_list of abbreviations.pdf71.36 kBAdobe PDFView/Open
11_chapter 1.pdf228.67 kBAdobe PDFView/Open
12_chapter 2.pdf197.4 kBAdobe PDFView/Open
13_chapter 3.pdf402.36 kBAdobe PDFView/Open
14_chapter 4.pdf2.67 MBAdobe PDFView/Open
15_chapter 5.pdf317.14 kBAdobe PDFView/Open
16_chapter 6.pdf412.4 kBAdobe PDFView/Open
17_chapter 7.pdf156.53 kBAdobe PDFView/Open
18_references.pdf207.92 kBAdobe PDFView/Open

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