Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/4232
Title: Magnetic, electrical and surface morphological characterization of AuGe/Ni/Au Ohmic contact metallization on GaAs/AlGaAs multilayer structures
Researcher: Abhilash, T S
Guide(s): Guruswamy, Rajaram
Keywords: Physics
Micro Hall Magnetic Sensors
Ohmic Contact Formation
AuGe alloy
Upload Date: 14-Aug-2012
University: University of Hyderabad
Completed Date: January 2010
Abstract: None
Pagination: 145p.
URI: http://hdl.handle.net/10603/4232
Appears in Departments:School of Physics

Files in This Item:
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01_title.pdfAttached File264.41 kBAdobe PDFView/Open
02_declaration.pdf67.74 kBAdobe PDFView/Open
03_certificate.pdf304.75 kBAdobe PDFView/Open
04_acknowledgements.pdf77.97 kBAdobe PDFView/Open
05_dedication.pdf49.61 kBAdobe PDFView/Open
06_table of contents.pdf96.66 kBAdobe PDFView/Open
07_outline.pdf74.79 kBAdobe PDFView/Open
08_chapter 1.pdf935.81 kBAdobe PDFView/Open
09_chapter 2.pdf1.12 MBAdobe PDFView/Open
10_chapter 3.pdf2.49 MBAdobe PDFView/Open
11_chapter 4.pdf823.89 kBAdobe PDFView/Open
12_chapter 5.pdf1.27 MBAdobe PDFView/Open
13_chapter 6.pdf970.56 kBAdobe PDFView/Open
14_chapter 7.pdf301.48 kBAdobe PDFView/Open
15_chapter 8.pdf135.6 kBAdobe PDFView/Open
16_publications.pdf2.31 MBAdobe PDFView/Open


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