Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/31780
Title: Some optimum fully and partially accelerated life testing models in reliability
Researcher: Mittal, Neha
Guide(s): Srivastava, Preeti Wanti
Keywords: optimum
partially accelerated
reliability
Upload Date: 26-Dec-2014
University: University of Delhi
Completed Date: 2013
Abstract: Available
Pagination: 322p.
URI: http://hdl.handle.net/10603/31780
Appears in Departments:Dept. of Operational Research

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File78.45 kBAdobe PDFView/Open
02_dedication.pdf33.2 kBAdobe PDFView/Open
03_declaration.pdf12.6 kBAdobe PDFView/Open
04_acknowledgement.pdf37.46 kBAdobe PDFView/Open
05_contents.pdf32.69 kBAdobe PDFView/Open
06_list of acronyms, tables, figures, research papers.pdf71.68 kBAdobe PDFView/Open
07_chapter 1.pdf692.47 kBAdobe PDFView/Open
08_chapter 2.pdf257.55 kBAdobe PDFView/Open
09_chapter 3.pdf277.84 kBAdobe PDFView/Open
10_chapter 4.pdf282.71 kBAdobe PDFView/Open
11_chapter 5.pdf313.29 kBAdobe PDFView/Open
12_future scope.pdf62.33 kBAdobe PDFView/Open
13_appendices.pdf618.46 kBAdobe PDFView/Open
14_references.pdf157.25 kBAdobe PDFView/Open
15_abstract.pdf58.05 kBAdobe PDFView/Open


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