Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/3116
Title: Non-destructive evaluation of ion-implanted semiconductor thin films using Photothermal Deflection Spectroscopy
Researcher: Paulraj, M
Guide(s): Vijayakumar, K P
Keywords: Physics
Semiconductor physics
Photothermal Deflection Spectroscopy
Upload Date: 31-Oct-2011
University: Cochin University of Science and Technology
Completed Date: 30/12/2004
Pagination: viii, 256p.
URI: http://hdl.handle.net/10603/3116
Appears in Departments:Department of Physics

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File25.61 kBAdobe PDFView/Open
02_certificate.pdf33.76 kBAdobe PDFView/Open
03_declaration.pdf23.83 kBAdobe PDFView/Open
04_acknowledgement.pdf80.92 kBAdobe PDFView/Open
05_dedication.pdf10.45 kBAdobe PDFView/Open
06_contents.pdf158.14 kBAdobe PDFView/Open
07_preface.pdf148.44 kBAdobe PDFView/Open
08_list of publications.pdf113.4 kBAdobe PDFView/Open
09_chapter 1.pdf1.6 MBAdobe PDFView/Open
10_chapter 2.pdf1.57 MBAdobe PDFView/Open
11_chapter 3.pdf2.49 MBAdobe PDFView/Open
12_chapter 4.pdf1.32 MBAdobe PDFView/Open
13_chapter 5.pdf1.08 MBAdobe PDFView/Open
14_chapter 6.pdf805.42 kBAdobe PDFView/Open
15_chapter 7.pdf253.8 kBAdobe PDFView/Open


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