Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/305527
Title: Studies on microstructure and optoelectronic properties of metal oxide nanostructured coatings
Researcher: Bynaja J V
Guide(s): Bena Jothy V
Keywords: Physical Sciences
Physics
Physics Applied
University: Manonmaniam Sundaranar University
Completed Date: 2019
Abstract: The chosen research problem is all about preparation and property newlineanalysis of metal oxide thin films. Among the available metal oxides, newlinechromium (III) oxide has been identified as a unique, dense, newlinethermodynamically stable at temperatures beyond 500 °C. It is the hardest newlinetransition metal oxide. In the present study, chromium oxide (Cr2O3) thin films newlinehave been prepared using the spray pyrolysis method. Metal ion doping is a newlinepromising method that influences the features of the material by intentionally newlineadding impurities or defects into the lattice. Hence, with the pure chromium newlineoxide thin films, transition metal ion (Mg, Fe, and Sn) doped Cr2O3 film newlinesamples were prepared in the spray pyrolysis method for varied dopant newlineconcentrations (2, 4, 6 and 8 wt. %). All the employed studies revealed good newlineresults and hence the formulated thesis is in full satisfaction that is provocative newlinein all respects. newlineAs various polymorphs are available for chromium oxide, thin layered newlinecoatings of hexagonal Cr2O3 have been deposited using spray pyrolyzed newlinechemical vapor deposition technique on glass substrates at 300 °C temperature. newlineUsing chromium nitrate precursor by varying the solution concentration, X-ray newlinediffraction outcomes showed that the deposited films were polycrystalline newlinenature and the vibrational characteristics were examined using Fourier newlinetransform infrared spectroscopic analysis. By increasing the chromium content, newlinethe transmission of light reduced and the optical study showed a direct type newlinetransition. Photoluminescence measurements were performed to investigate the newlinecarrier localization consequences and the evolution of peaks corresponding to newlineprecise wavelengths. The chemical compositions of the chromium oxide thin newlinefilm surface layer were computed by EDAX and XPS measurements. newlineMorphological observations indicated the compactness of grains and the newlineparticle structure varied significantly as the concentration increases. VSM newlinemeasurement denoted antiferromagnetic behavior at room temperature in favor newlineof chromium oxide films correspon
Pagination: xvi, 201p.
URI: http://hdl.handle.net/10603/305527
Appears in Departments:Department of Physics

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05_table of content.pdf32.49 kBAdobe PDFView/Open
06_list of table.pdf16.35 kBAdobe PDFView/Open
07_list of figures.pdf48.71 kBAdobe PDFView/Open
08_abbreviations.pdf23.14 kBAdobe PDFView/Open
09_chapter 1.pdf45.26 kBAdobe PDFView/Open
10_chapter 2.pdf330.05 kBAdobe PDFView/Open
11_chapter 3.pdf1.84 MBAdobe PDFView/Open
12_chapter 4.pdf1.23 MBAdobe PDFView/Open
13_chapter 5.pdf521.79 kBAdobe PDFView/Open
14_chapter 6.pdf476.75 kBAdobe PDFView/Open
15_chapter 7.pdf556.62 kBAdobe PDFView/Open
16_chapter 8.pdf634.2 kBAdobe PDFView/Open
17_references.pdf178.29 kBAdobe PDFView/Open
80_recommendation.pdf28.31 kBAdobe PDFView/Open


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