Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/25230
Title: Investigations on the growth and characterization of znte thin films deposited by Silar method for possible window applications
Researcher: Rathod, Jignesh R
Guide(s): Pathak, V M
Keywords: Silar method
thin films
Upload Date: 18-Sep-2014
University: Sardar Patel University
Completed Date: 2014
Abstract: None
Pagination: 326p.
URI: http://hdl.handle.net/10603/25230
Appears in Departments:Department of Physics

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File143.02 kBAdobe PDFView/Open
02_certificate.pdf357.3 kBAdobe PDFView/Open
03_dedication.pdf20.12 kBAdobe PDFView/Open
04_ acknowledgement.pdf221.77 kBAdobe PDFView/Open
05_ index.pdf454.94 kBAdobe PDFView/Open
06_preface.pdf303.62 kBAdobe PDFView/Open
07_chapter 1.pdf1.03 MBAdobe PDFView/Open
08_chapter 2.pdf1.63 MBAdobe PDFView/Open
09_chapter 3.pdf2.82 MBAdobe PDFView/Open
10_chapter 4.pdf1.94 MBAdobe PDFView/Open
11_chapter 5.pdf2.85 MBAdobe PDFView/Open
12_chapter 6.pdf3 MBAdobe PDFView/Open
13_chapter 7.pdf436.29 kBAdobe PDFView/Open
14_annexure.pdf254.17 kBAdobe PDFView/Open


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