Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/23842
Title: Development of algorithms for test generation and simulation of crosstalk delay faults in vlsi circuits
Researcher: Jayanthy S
Guide(s): Bhuvaneswari M C
Keywords: crosstalk delay
electrical engineering
vlsi circuits
Upload Date: 21-Aug-2014
University: Anna University
Completed Date: 01/02/2012
Abstract: Very Large Scale Integration VLSI is the fabrication of millions newlineof components on the same chip and is an integral part of modern electronic newlinesystems Due to the significant advances in VLSI technology new Automatic newlineTest Pattern Generation ATPG problems are emerging The move towards newlinedeep submicron technology introduces timing related defects that change the newlinetiming of the circuit instead of its function Timing related defects include newlineexternal noise sources and process variations newlineOf the various noise sources crosstalk noise will have significant newlineimpact on the performance of deep submicron systems Crosstalk can induce newlineboth logic errors and delay faults While many techniques have been proposed newlineto reduce crosstalk due to limited design margin and unpredictable process newlinevariations testing for crosstalk must be performed during manufacturing to newlineenhance device reliability and yield Hence efficient test generation newlinemethodologies for crosstalk delay faults have to be developed newline newline
Pagination: xx,175p.
URI: http://hdl.handle.net/10603/23842
Appears in Departments:Faculty of Electrical and Electronics Engineering

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01_title.pdfAttached File175.25 kBAdobe PDFView/Open
02_certificates.pdf2.92 MBAdobe PDFView/Open
03_abstract.pdf62.04 kBAdobe PDFView/Open
04_acknowledgement.pdf1.08 MBAdobe PDFView/Open
05_contents.pdf132.73 kBAdobe PDFView/Open
06_chapter 1.pdf130.83 kBAdobe PDFView/Open
07-chapter 2.pdf189.89 kBAdobe PDFView/Open
08_chapter 3.pdf290.48 kBAdobe PDFView/Open
09_chapter 4.pdf209.08 kBAdobe PDFView/Open
10_chapter 5.pdf303.79 kBAdobe PDFView/Open
11_chapter 6.pdf237.33 kBAdobe PDFView/Open
12_chapter 7.pdf156.12 kBAdobe PDFView/Open
13_chapter 8.pdf80.71 kBAdobe PDFView/Open
14_references.pdf112.61 kBAdobe PDFView/Open
15_publications.pdf70.94 kBAdobe PDFView/Open
16_vitae.pdf50.77 kBAdobe PDFView/Open


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