Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/230273
Title: Study on bulk and ultrathin layers of vxw1 xse2 van der waals ternary alloy single crystals growth characterization and optoelectronic applications
Researcher: Pataniya, Pratik. M.
Guide(s): Solanki, G. K.
University: Sardar Patel University
Completed Date: 2018
Abstract: newline
Pagination: 199p
URI: http://hdl.handle.net/10603/230273
Appears in Departments:Department of Physics

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01_title.pdfAttached File126.04 kBAdobe PDFView/Open
02_certificate.pdf165.19 kBAdobe PDFView/Open
03_abstract.pdf138.66 kBAdobe PDFView/Open
04_acknowlwdgement.pdf154 kBAdobe PDFView/Open
05_contents.pdf86.22 kBAdobe PDFView/Open
06_chapter1.pdf249.13 kBAdobe PDFView/Open
07_chapter2.pdf452.6 kBAdobe PDFView/Open
08_chapter3.pdf620.22 kBAdobe PDFView/Open
09_chapter4.pdf577.4 kBAdobe PDFView/Open
10_chapter5.pdf717.48 kBAdobe PDFView/Open
11_chapter6.pdf645.43 kBAdobe PDFView/Open
12_chapter7.pdf627.05 kBAdobe PDFView/Open
13_chapter8.pdf498.85 kBAdobe PDFView/Open
14_chapter9.pdf159.33 kBAdobe PDFView/Open
15_summary.pdf160.3 kBAdobe PDFView/Open


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