Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/224080
Title: Development of low valued capacitance measurement systems and their applications for dielectric and insulation characterization
Researcher: Sarkar, Gautam
Guide(s): Rakshit, Anjan, Bhattacharya, Kesab, and Chatterjee, Amitava
Keywords: Capacitance measurement systems
Engineering and Technology,Engineering,Engineering Electrical and Electronic
Low-valued capacitance measurement systems
Power frequency range
University: Jadavpur University
Completed Date: 2014
Abstract: None newline
Pagination: xv, 128 p.
URI: http://hdl.handle.net/10603/224080
Appears in Departments:Department of Electrical Engineering

Files in This Item:
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01_title.pdfAttached File8.6 kBAdobe PDFView/Open
02_list of publication.pdf13.46 kBAdobe PDFView/Open
03_certificate.pdf33.79 kBAdobe PDFView/Open
04_dedication.pdf14.19 kBAdobe PDFView/Open
05_acknowledgement.pdf39.56 kBAdobe PDFView/Open
06_content.pdf17.14 kBAdobe PDFView/Open
07_figures.pdf28.42 kBAdobe PDFView/Open
08_list of tabels.pdf12.15 kBAdobe PDFView/Open
09_list of algorithems.pdf7.79 kBAdobe PDFView/Open
10_chapter 1.pdf35.04 kBAdobe PDFView/Open
11_chapter 2.pdf459.57 kBAdobe PDFView/Open
12_chapter 3.pdf694.13 kBAdobe PDFView/Open
13_chapter 4.pdf2.09 MBAdobe PDFView/Open
14_chapter 5.pdf36.14 kBAdobe PDFView/Open
15_bibliography.pdf84.67 kBAdobe PDFView/Open


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