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Title: An Analytical Study on Temperature Dependence of Nanoscale Digital CMOS Circuits using Charge Based a Power MOSFET Model and an Illustrative Design Application of a Digital Temperature Sensor
Researcher: Kalra, Shruti
Guide(s): Srivastava, Shweta and Bhattacharyya, A.B.
Keywords: MOSFET technology
parameter fluctuations
silicon foundries
ultra-large-scaleintegrated chips
University: Jaypee Institute of Information Technology
Completed Date: 27/08/2018
Abstract: included newline
Appears in Departments:Department of Computer Science and Engineering

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01_title.pdfAttached File138.77 kBAdobe PDFView/Open
02_table of contents.pdf55.47 kBAdobe PDFView/Open
03_declaration.pdf52.79 kBAdobe PDFView/Open
04_certificate.pdf52.77 kBAdobe PDFView/Open
05_acknowledgement.pdf42.56 kBAdobe PDFView/Open
06_abstract.pdf42.11 kBAdobe PDFView/Open
07_list of acronyms and abbreviations.pdf41.6 kBAdobe PDFView/Open
08_list of symbols.pdf74.89 kBAdobe PDFView/Open
09_list of figures and tables.pdf93.39 kBAdobe PDFView/Open
10_chapter1.pdf522.14 kBAdobe PDFView/Open
11_chapter2.pdf1.5 MBAdobe PDFView/Open
12_chapter3.pdf6.83 MBAdobe PDFView/Open
13_chapter4.pdf1.5 MBAdobe PDFView/Open
14_chapter5.pdf577.76 kBAdobe PDFView/Open
15_chapter6.pdf98.52 kBAdobe PDFView/Open
16_references.pdf90.9 kBAdobe PDFView/Open
17_list of publications.pdf74.7 kBAdobe PDFView/Open
18_synopsis.pdf101 kBAdobe PDFView/Open

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