Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/20728
Title: Studies on preparation and characterization of mgf2 and yf5 multilayer antireflection thin films
Researcher: Atchaiah Naidu V
Guide(s): Kistaiah P
Keywords: antireflection thin film
Upload Date: 11-Jul-2014
University: Osmania University
Completed Date: 20/01/2014
Abstract: newline
Pagination: 178p
URI: http://hdl.handle.net/10603/20728
Appears in Departments:Department of Physics

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File186.51 kBAdobe PDFView/Open
02_declaration.pdf70.51 kBAdobe PDFView/Open
03_certificate.pdf75.35 kBAdobe PDFView/Open
04_acknowledgements.pdf145.5 kBAdobe PDFView/Open
05_preface.pdf663.45 kBAdobe PDFView/Open
06_contents.pdf373.46 kBAdobe PDFView/Open
07_chapter_1.pdf5.7 MBAdobe PDFView/Open
08_chapter_2.pdf4.29 MBAdobe PDFView/Open
09_chapter_3.pdf5.03 MBAdobe PDFView/Open
10_chapter_4.pdf23.89 MBAdobe PDFView/Open
11_chapter_5.pdf2.62 MBAdobe PDFView/Open


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