Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/19655
Title: Fabrication and characterization studies in organic semiconductor thin films of H2PcOC8 ZnPcOC8 and CuPcOC8
Researcher: Vadakel, Vinu T
Guide(s): Menon, C S
Keywords: Copper octakis octyloxy phthalocyanines
Octakis octyloxy phthalocyanines
Organic semiconductor
Phthalocyanines
Thin films
Zinc octakis octyloxy phthalocyanines
Upload Date: 23-Jun-2014
University: Mahatma Gandhi University
Completed Date: 25/06/2012
Abstract: The present investigation comprises of the studies on the electrical, optical and structural characterisations of H2PcOC8, ZnPcOC8 and CuPcOC8 thin films. The effects of gamma irradiation on the optical and electrical properties are also studied. Powdered samples of spectroscopically pure H2PcOC8, ZnPcOC8 and CuPcOC8 obtained from Sigma Aldrich Chemical Company, USA are used as the source material. Thin films are prepared at a base pressure of 10-6 m. bar using Hind Hivac 12 A4 thermal evaporation plant. Thicknesses of the films are measured using Tolansky s multiple beam interference technique. The films are annealed in air and vacuum for one hour. Electrical studies are performed using a programmable Keithley electrometer (model No. 617). The effects of air and vacuum annealed samples on the electrical conductivity are also studied. Activation energies are determined. Optical characterisations of the thin films are carried out with different thicknesses and for different air and vacuum annealing temperatures. Absorption spectra of these thin films are recorded using Shimadzu 160 A spectrophotometer. Band gaps are determined in each case. Structure of the thin films is studied by X-ray diffractograms (XRD). Surface morphological characterisations of these thin films are done using JEOL JSM 6390 Scanning Electron Microscope (SEM). The effects of gamma irradiations on the optical and electrical properties are also studied by irradiating the thin films with gamma rays using Gamma ray Chamber 5000 newline
Pagination: xxxiv, 217p.
URI: http://hdl.handle.net/10603/19655
Appears in Departments:School of Pure and Applied Physics

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01_title.pdfAttached File28.79 kBAdobe PDFView/Open
02_dedication.pdf20.29 kBAdobe PDFView/Open
03_declaration.pdf36.81 kBAdobe PDFView/Open
04_certificate.pdf55.03 kBAdobe PDFView/Open
05_acknowledgement.pdf28.81 kBAdobe PDFView/Open
06_abstract.pdf27.12 kBAdobe PDFView/Open
07_preface.pdf69.05 kBAdobe PDFView/Open
08_list_of_publications.pdf55.45 kBAdobe PDFView/Open
09_contents.pdf46.06 kBAdobe PDFView/Open
10_list_of_tables.pdf32.04 kBAdobe PDFView/Open
11_list_of_figures.pdf68.69 kBAdobe PDFView/Open
12_chapter1.pdf348.81 kBAdobe PDFView/Open
13_chapter2.pdf1.15 MBAdobe PDFView/Open
14_chapter3.pdf195.35 kBAdobe PDFView/Open
15_chapter4.pdf636.43 kBAdobe PDFView/Open
16_chapter5.pdf1.45 MBAdobe PDFView/Open
17_chapter6.pdf328.28 kBAdobe PDFView/Open
18_summary.pdf62.18 kBAdobe PDFView/Open


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