Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/17467
Title: Stress induced defects under Mev Ion iiradiation and their annealing behaviour
Researcher: Aggarwal, Guatam
Guide(s): Sen, Prasenjit
Keywords: Physcial Sciences
mev Ion iiradiation
annealing behaviour
stress
induced defects
Upload Date: 13-Mar-2014
University: Jawaharlal Nehru University
Completed Date: 1999
Abstract: None
Pagination: 95p.
URI: http://hdl.handle.net/10603/17467
Appears in Departments:School of Physcial Sciences

Files in This Item:
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01_title.pdfAttached File60.28 kBAdobe PDFView/Open
02_declaration.pdf105.42 kBAdobe PDFView/Open
03_dedication.pdf84.18 kBAdobe PDFView/Open
04_acknowledgements.pdf82.31 kBAdobe PDFView/Open
05_list of publications.pdf76.08 kBAdobe PDFView/Open
06_contents.pdf137.7 kBAdobe PDFView/Open
07_chapter 1.pdf1.53 MBAdobe PDFView/Open
08_chapter 2.pdf597.69 kBAdobe PDFView/Open
09_chapter 3.pdf956.55 kBAdobe PDFView/Open
10_chapter 4.pdf957.32 kBAdobe PDFView/Open
11_chapter 5.pdf237.78 kBAdobe PDFView/Open
12_references.pdf289.18 kBAdobe PDFView/Open


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