Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/139962
Title: Surface deformation study of Bi2S3 Sb2S3 As2S3 thin films by double exposure holographic interferometry technique
Researcher: Shinde, Nitin Shivajirao
Guide(s): Fulari, V J
Keywords: Bleaching
Exposure
Hologram
Holographic
Interferometry
University: Shivaji University
Completed Date: 2009
Abstract: Abstract not available
Pagination: xiv, 237p.
URI: http://hdl.handle.net/10603/139962
Appears in Departments:Department of Physics

Files in This Item:
File Description SizeFormat 
01_title page.pdfAttached File17.06 kBAdobe PDFView/Open
02_dedication.pdf347.78 kBAdobe PDFView/Open
03_certificate.pdf30.48 kBAdobe PDFView/Open
04_declaration.pdf17.38 kBAdobe PDFView/Open
05_acknowledgement.pdf99.08 kBAdobe PDFView/Open
06_list of publication.pdf97.47 kBAdobe PDFView/Open
07_index.pdf260.19 kBAdobe PDFView/Open
08_chapter 1.pdf3.7 MBAdobe PDFView/Open
09_chapter 2.pdf2.67 MBAdobe PDFView/Open
10_chapter 3.pdf1.28 MBAdobe PDFView/Open
11_chapter 4.pdf1.66 MBAdobe PDFView/Open
12_chapter 5.pdf5.37 MBAdobe PDFView/Open
13_chapter 6.pdf3.9 MBAdobe PDFView/Open
14_summary and conclusions.pdf454.72 kBAdobe PDFView/Open


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